A rapid detection method for the surface defects of mosaic ceramic tiles

Due to its unique artistic value, mosaic ceramics are widely used in construction-related fields. To meet the artist's demand for high-quality mosaic ceramic to create artistic works, it is necessary to meet the needs for efficient screening of mosaic ceramic tiles. Different from the ordinary large-target ceramics, mosaic ceramics exhibit characteristics of small tile sizes, a variety of colors, large demand for quantities, and easy reflection on the surface. Common manual detection methods show problems of low efficiency or accuracy, easy to fatigue, and many others. To solve these problems, this paper proposes a new detection method to identify surface defects of mosaic ceramic tiles and designs a detection system platform to achieve rapid detection. The experiment proves that the detection system has a detection rate of 93.99% for small defects on the surface of mosaic ceramic tiles, and the detection time of a single mosaic ceramic tile is less than 0.06 s. The detection method can quickly and accurately screen out high-quality, defect-free mosaic ceramic tiles, which can effectively improve the quality and artistic value of mosaic ceramic art creation.     

Thickness dependent barrier performance of permeation barriers made from atomic layer deposited alumina for organic devices

Organic devices like organic light emitting diodes (OLEDs) or organic solar cells degrade fast when exposed to ambient air. Hence, thin-films acting as permeation barriers are needed for their protection. Atomic layer deposition (ALD) is known to be one of the best technologies to reach barriers with a low defect density at gentle process conditions. As well, ALD is reported to be one of the thinnest barrier layers, with a critical thickness – defining a continuous barrier film – as low as 5–10 nm for ALD processed Al₂O₃. In this work, we investigate the barrier performance of Al₂O₃ films processed by ALD at 80 °C with trimethylaluminum and ozone as precursors. The coverage of defects in such films is investigated on a 5 nm thick Al₂O₃ film, i.e. below the critical thickness, on calcium using atomic force microscopy (AFM). We find for this sub-critical thickness regime that all spots giving raise to water ingress on the 20 × 20 μm² scan range are positioned on nearly flat surface sites without the presence of particles or large substrate features. Hence below the critical thickness, ALD leaves open or at least weakly covered spots even on feature-free surface sites. The thickness dependent performance of these barrier films is investigated for thicknesses ranging from 15 to 100 nm, i.e. above the assumed critical film thickness of this system. To measure the barrier performance, electrical calcium corrosion tests are used in order to measure the water vapor transmission rate (WVTR), electrodeposition is used in order to decorate and count defects, and dark spot growth on OLEDs is used in order to confirm the results for real devices. For 15–25 nm barrier thickness, we observe an exponential decrease in defect density with barrier thickness which explains the likewise observed exponential decrease in WVTR and OLED degradation rate. Above 25 nm, a further increase in barrier thickness leads to a further exponential decrease in defect density, but an only sub-exponential decrease in WVTR and OLED degradation rate. In conclusion, the performance of the thin Al₂O₃ permeation barrier is dominated by its defect density. This defect density is reduced exponentially with increasing barrier thickness for alumina thicknesses of up to at least 25 nm.     

Smart optical measurement probe for autonomously detecting nano-defects on bare semiconductor wafer surface: Verification of proposed concept

We propose a new method of inspecting a surface for fine defects that combines the optical inspection method with observation of the physical behavior of a liquid. A liquid thin film on a substrate behaves as a near-field physical probe that autonomously captures nano-particulate defects. Optical observation of the interfacial behavior of the liquid thin film is used to detect minute defects. This method combines the characteristics of optical detection (i.e., detection from a remote field and simultaneous detectability on a plane) and the high sensitivity of a physical near-field probe. We examined the basic principles of the proposed method through numerical calculation and applied it in experiments to detect fine particulate defects on a silicon substrate for semiconductor manufacturing to demonstrate the validity of the basic concept of the proposed method.     

Modeling ion implantation of HgCdTe

Ion implantation of boron is used to create n on p photodiodes in vacancy-doped mercury cadmium telluride (MC.T). The junction is formed by Hg interstitials from the implant damage region diffusing into the MC.T and annihilating Hg vacancies. The resultant doping profile is n⁺/n^-/p, where the n⁺ region is near the surface and roughly coincides with the implant damage, the n^- region is where Hg vacancies have been annihilated revealing a residual grown-in donor, and the p region remains doped by Hg vacancy double acceptors. We have recently developed a new process modeling tool for simulating junction formation in MC.T by ion implantation. The interstitial source in the damage region is represented by stored interstitials whose distribution depends on the implant dose. These interstitials are released into the bulk at a constant, user defined rate. Once released, they diffuse away from the damage region and annihilate any Hg vacancies they encounter. In this paper, we present results of simulations using this tool and show how it can be used to quantitatively analyze the effects of variations in processing conditions, including implant dose, annealing temperature, and doping background.     

Reliability and scale effect in toughness of concrete structures

In the present work, the distribution of the random toughness characteristics (i.e. critical energy release rate, G_1c) has been evaluated on the basis of experimental observations. Fracture test results from three groups of geometrically similar concrete specimens of size (width×total depth×thickness), 420×420×50–1680×1680×200 mm³, made with different maximum aggregate size of 9.5, 19, 38, and 76 mm were analyzed using a recently proposed distribution of extremes. In applications of probability, it is important to use an appropriate distribution type and adequate techniques for estimating the parameters of distribution. In this study, a new type distribution of minima is employed for probability computations. It was noticed that the entropy of distribution increases with the crack length, i.e. the uncertainty of toughness, G_1c, value increases with crack length. A non-linear reduction of the maximum allowable splitting force with the defect size, a, was noticed. For large specimens, the maximum allowable splitting load is more sensitive to the required reliability level than that for small specimens. Reliability increases with aggregate size when all other conditions were constant.     

Successive pattern classification based on test feature classifier and its application to defect image classification

A novel successive learning algorithm based on a Test Feature Classifier is proposed for efficient handling of sequentially provided training data. The fundamental characteristics of the successive learning are considered. In the learning, after recognition of a set of unknown data by a classifier, they are fed into the classifier in order to obtain a modified performance. An efficient algorithm is proposed for the incremental definition of prime tests which are irreducible combinations of features and capable of classifying training patterns into correct classes. Four strategies for addition of training patterns are investigated with respect to their precision and performance using real pattern data. A real-world problem of classification of defects on wafer images has been dealt with by the proposed classifier, obtaining excellent performance even through efficient addition strategies.     

Fabrication and Characterization of Two‐Photon Polymerized Features in Colloidal Crystals

The fabrication and characterization of two‐photon polymerized features written within and outside of colloidal crystals is presented. Two‐photon polymerization (TPP) response diagrams are introduced and developed to map the polymerization and damage thresholds for features written via modulated beam rastering. The use of tris[4‐(7‐benzothiazol‐2‐yl‐9,9‐diethylfluoren‐2‐yl)phenyl]amine (AF‐350) as an initiator for TPP is demonstrated for the first time and TPP response diagrams illustrate the polymerization window. These diagrams also demonstrate that the polymerization behavior within and outside of colloidal crystals is similar and electron microscopy reveals nearly identical resolution. Fluorescence confocal microscopy further enables visualization of non‐self‐supporting, three‐dimensional TPP features within self‐assembled photonic crystals. Finally, microspot spectroscopy is collected from a two‐photon feature written within a colloidal crystal and this is compared with simulation.     

Irradiation Defects in Silicon Crystal

The application of irradiation in silicon crystal is introduced.The defects caused by irradiation are reviewed and some major ways of studying defects in irradiated silicon are summarized.Furthermore the problems in the investigation of irradiated silicon are discussed as well as its properties.